PIC, Wafer, & Co-Packaged Optics Testing
As optical technologies supersede energy-intensive copper communication links, the rise of high-speed and high-channel-count photonic integrated circuits and co-packaged optics is gathering pace to support the explosive growth in AI, machine learning and high-performance computing.
It’s critical that test and measurement instrumentation adapts to meet these rapidly changing requirements.
Silicon photonics, PIC and CPO adoption is gathering speed
New devices such as Broadcom’s 51.2T switch with eight 64-channel silicon photonic engines, and Intel’s Optical Compute Interconnect (OCI) 4 Tbps bidirectional chiplet with 64 lanes over 8 fiber pairs, present new challenges to the test engineer.
PICs are scaling fast, and so must testing strategies
Scalable, integrated test systems that are capable of efficiently testing devices with dozens or hundreds of channels are required. They must consider the product life-cycle, from R&D, to validation/characterization, to high-volume manufacturing, as well as each stage of the production process from wafer to packaged module. Each stage may involve distinct measurements, standards and equipment while capturing measurements with speed, accuracy, and efficiency.
Test setups themselves can become bottlenecks. Automated test systems are evolving, but with high-channel-count PICs, they can still struggle to keep up, leading to testing queues and downtime in high-throughput labs. Modular test solutions that allow quick channel-switching and parallel measurements are game-changers, reducing total test time and minimizing error.
For optical engineers tackling PIC testing, considering how setup flexibility and fast channel-switching impact throughput and data accuracy is critical.
PXI is the way forward for high-volume PIC testing
Integrated Photonics Systems Roadmap – International (IPSR-I) publishes a roadmap to define future needs and help facilitate the volume manufacturing of PICs between industry participants. The IPSR’s 2024 roadmap photonic device testing defines various test requirements at different stages of production, from wafer, to die, to assembled module and states that test equipment will need to move from a lab rack-and-stack to dedicated instruments in PXI format to provide flexibility to meet different test needs.
Ask us about scalable, cost-effective PIC test solutions
Our aim is to help customers unlock scalable and cost-effective high-volume manufacturing of photonic integrated circuits (PICs), co-packaged optics and pluggable optics. As the premier supplier of photonic PXI instruments, we are a preferred partner for ATE suppliers, foundries, OSATs, contract manufacturers, and end customers across the photonics ecosystem. Our scalable, innovative product architecture enables efficient testing of next-generation PICs and optical interconnects used by AI companies, hyperscalers and network operators to support the explosive growth in AI, machine learning and high-performance computing.
Test solution examples
Learn more
ON-DEMAND WEBINAR
Integrated Photonics for the AI Revolution – An Ecosystem Perspective
Artificial Intelligence and High-Performance Computing are accelerating the demand for next-generation optical interconnects, with photonic integrated circuits (PICs) as one of the key enablers of this (r)evolution. These wafer-based technologies are ideal for high channel count and high-density optical interconnects such as In-Package Optical I/O and Co-Packaged Optics but have unique challenges.
ON-DEMAND WEBINAR
Disaggregation and Optical Interconnect in AI/HPC Networks
Artificial intelligence is taking our industry and the world by storm and astute companies have been planning ahead for this rapid technology transition.
Hear from industry leaders at NVIDIA, Microsoft, GlobalFoundries, Hyperion Research, Ayar Labs as they provide perspectives from across the ecosystem, and discuss the latest technology advances in readiness for the wave of AI and high-performance computing networks. Kees Propstra, VP Marketing and GM of Quantifi Photonics USA, will provide his perspective on test and measurement solutions that are needed support this new wave of interconnect technology.
ON-DEMAND WEBINAR
Challenges and Strategies for High-Volume Manufacturing and Testing of Co-Packaged Optics
Artificial intelligence is taking our industry and the world by storm and astute companies have been planning ahead for this rapid technology transition.
Hear from industry leaders at NVIDIA, Microsoft, GlobalFoundries, Hyperion Research, Ayar Labs as they provide perspectives from across the ecosystem, and discuss the latest technology advances in readiness for the wave of AI and high-performance computing networks. Kees Propstra, VP Marketing and GM of Quantifi Photonics USA, will provide his perspective on test and measurement solutions that are needed support this new wave of interconnect technology.
WHITE PAPER
Testing Strategies for Next-Generation Optical Interconnects: Co-Packaged Optics & Integrated Photonics
This white paper discusses industry trends in integrated photonics and how market participants are adapting to test and mass produce next-generation optical interconnects in a cost-effective manner. The traditional semi-conductor ecosystem is the example for the industry and parallels can be made with the current evolution of the integrated photonics ecosystem.
