In this webinar you’ll learn about the capabilities and advantages of using PXI-based photonics test instrumentation from Lawrence van der Vegt, Director of Test & Measurement at Quantifi Photonics.
Engineers face new challenges testing next-generation photonics devices and interconnects including Photonic Integrated Circuits (PIC), Co-Packaged Optics (CPO), Silicon Photonics, optical transceivers and other advanced optical-electrical devices. These challenges arise at all stages of the product life cycle, from R&D to high-volume manufacturing.
They must also consider streamlining integration with other equipment to optimize test flows and throughput, the ability to cost-effectively test devices with rapidly increasing channel counts, and support variable test parameters. Traditional photonics test instrumentation makes this extremely difficult.
PXI is an open-standard which simplifies the integration of optical and electrical test instruments to build efficient, automated electro-optical (mixed-signal) test systems on a single platform. Since test and validation contribute significantly to overall production cost, improving test efficiency can significantly lower cost of test as well as speed up time to market.
TIME & DATE
4 pm EST, Wednesday 31 May, 2023
DURATION
45 minutes + Q&A
TOPICS
- Introduction to Quantifi Photonics
- Trends and developments in photonics test
- Advantages of PXI
- Overview of optical test instrumentation
- Examples of photonic applications test configurations
ABOUT THE SPEAKER
Lawrence van der Vegt
Director Test & Measurement
Quantifi Photonics
Lawrence has a long career in optical test and measurement in the Netherlands and United States, working with customers on a global scale. He earned his bachelor’s degree in electrical and computer engineering in the Netherlands and has held a variety of optics test and measurement roles at Ando, Apex Technologies, and Yenista Optics, and was a Subject Matter Expert and Product Line Manager at EXFO before joining Quantifi Photonics.
